The Proposed Focused Ion Beam Field Emission Gun Scanning Electron Microscope Instrument... Tender

Procurement Summary

State : Telangana

Summary : The Proposed Focused Ion Beam Field Emission Gun Scanning Electron Microscope Instrument with a Focused Ion Beam and Field-Emission Electron Beam Columns is Intended Primarily for High Resolution Imag...

Deadline : 09 May 2023

Other Information

Notice Type : Tender

TOT Ref.No.: 81678814

Document Ref. No. : UoH/IoE/FIB-FEGSEM/2023/1

Financier : Self Financed

Purchaser Ownership : Public

Document Fees : Refer Document

Tender Value : ₹ 60000000

EMD : ₹ 2100000

Purchaser's Detail

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Tender Details

The Proposed Focused Ion Beam Field Emission Gun Scanning Electron Microscope Instrument with a Focused Ion Beam and Field-Emission Electron Beam Columns is Intended Primarily for High Resolution Imaging of a Variety of Materials
Title: Uoh/Ioe/Fib-Fegsem/2023/1
Tender ID : 2023_UoH_707635_1
Tender Category : Goods
Product Category : Laboratory and scientific equipment
Sub category : NA
Form Of Contract : Supply
Contract Type : Tender
Bid Validity(Days) : 90
Period Of Work(Days) : 180
Document Download / Sale Start Date : 15-Apr-2023 09:00 AM
Document Download / Sale End Date : 09-May-2023 05:00 PM
Bid Submission End Date : 09-May-2023 05:00 PM
Bid Opening Date : 12-May-2023 04:00 PM
EMD Amount in ₹ : 21, 00, 000
Tender Value in ₹ : 6, 00, 00, 000
Tender Fee in ₹ : 0.00

Documents

 Tender Notice