Procurement Summary
State: Karnataka
Summary: Atomic Force Microscope (Afm), Nano Indenter, Micro Hardness Tester, x-Ray Diffraction (xrd), Optical P, Qty: 1600
Deadline: 25 Aug 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 123877560
Document Ref. No.: GEM/2025/B/6391979
Financier: Self Financed
Purchaser Ownership: Public
Document Fees: Refer Document
Tender Value: Refer Document
EMD: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Atomic force Microscope (AFM), Nano indenter, Micro hardness tester, x-Ray Diffraction (xRD), Optical Profiler, Confocal Microscope, Raman Microscope, Spectroscopic Ellipsometer, Fourier - transform Infrared spectroscopy( FTIR), Energy dispersive spectrometry (EDx) & electron backscattered diffraction (EBSD), Co-Ordinate measuring Machine (CMM), Form Tester, Stereo Microscopy, Sample Preparation, Surface roughness tester (contact type)
Quantity Required: 1600
Start Date: 04-08-2025 4:03 PM
End Date: 25-08-2025 4:00 PM
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Documents
Tender Notice
Bid_Document_8020418.pdf