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Home » Global Semiconductor Tester Tenders and GPN from across the Globe

Global Semiconductor Tester Tenders and GPN from across the Globe

TendersOnTime provides latest updates on Global Semiconductor Tester Tenders, Contract Awards and various other opportunities related to Semiconductor Tester. The information on Semiconductor Tester tenders is collected from various sources viz: government tenders portal, tender bulletin and public procurement websites.

Semiconductor Low -Temperature Storage Tester

Deadline: 11 Apr 2025

South Korea

Deadline: 11 Apr 2025

TOT Reference No.: 117115187

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Bond Pull_Shear Tester for Defense Industry System Semiconductor Evaluation

Deadline: 10 Jan 2025

South Korea

Deadline: 10 Jan 2025

TOT Reference No.: 111281137

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[Bidding Notice] No. 2024-24_[Regional Revitalization Project] Purchase of Semiconductor Material and Process Technology Adhesion Tester

Deadline: 29 Nov 2024

South Korea

Deadline: 29 Nov 2024

TOT Reference No.: 110275077

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Semiconductor Discrete Device Tester

Deadline: 19 Nov 2024

China

Deadline: 19 Nov 2024

TOT Reference No.: 109750954

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[Dx] Purchase of Semiconductor Tester to Operate Career Transition Education Business

Deadline: 31 Oct 2024

South Korea

Deadline: 31 Oct 2024

TOT Reference No.: 109251283

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[Dx] Purchase of Semiconductor Tester to Operate Career Transition Education Business

Deadline: 29 Oct 2024

South Korea

Deadline: 29 Oct 2024

TOT Reference No.: 109141588

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[Dx] Purchase of Semiconductor Tester to Operate Career Transition Education Business

Deadline: 29 Oct 2024

South Korea

Deadline: 29 Oct 2024

TOT Reference No.: 109061298

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Purchase of Semiconductor Tester for Semiconductor Specialization University Project Group

Deadline: 30 Oct 2024

South Korea

Deadline: 30 Oct 2024

TOT Reference No.: 108843064

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Purchase of Dynamic High-Temperature and High-Humidity Bias Tester to Evaluate Power Semiconductor Lifespan and Reliability

Deadline: 23 Oct 2024

South Korea

Deadline: 23 Oct 2024

TOT Reference No.: 108782568

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Purchase of Dynamic High-Temperature and High-Humidity Bias Tester to Evaluate Power Semiconductor Lifespan and Reliability

Deadline: 30 Sep 2024

South Korea

Deadline: 30 Sep 2024

TOT Reference No.: 107385995

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