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Government Ion Microscope Online Tenders

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TendersOnTime provides the latest Ion Microscope online tenders and government procurement notices from various public sector organizations and agencies. Our platform helps suppliers, contractors, and service providers easily find relevant Ion Microscope tenders, including detailed tender information, bidding requirements, and submission deadlines sourced from official government tender portals and procurement publications.

By accessing updated Ion Microscope online tenders, businesses can discover new contract opportunities and participate in competitive government bidding processes. TendersOnTime ensures accurate and timely tender information so companies can stay informed about the latest Ion Microscope tenders and increase their chances of winning government projects.

Service Agreement

Deadline: 15 Nov 2026

USA

Deadline: 15 Nov 2026

TOT Reference No.: 151948848

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Procurement of Scientific Research and other Equipment for the Needs of the Project "Upgrading the Infrastructure of the Institute for Adriatic Cultures and Karst Reclamation as a Prerequisite for Excellence in Mediterranean Research...

Deadline: 04 Dec 2026

Croatia

Deadline: 04 Dec 2026

TOT Reference No.: 151901044

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Plasma Focused Ion Beam System & Time-Of-Flight Secondary Ion Mass Spectrometry

Deadline: 27 Nov 2026

Canada

Deadline: 27 Nov 2026

TOT Reference No.: 151882306

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Field Emission Scanning Transmission Electron Microscope and Dual-Gun Ion Focusing Microscope and Accessories

Deadline: 02 Dec 2026

Taiwan

Deadline: 02 Dec 2026

TOT Reference No.: 151869880

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Supply, Delivery, Installation and Construction of Scanning Ion Conductance Microscope Equipment at Care Institute, Uitm Sungai Buloh (mohe Hicoe Care-i (001/2025)-2).

Deadline: 23 Nov 2026

Malaysia

Deadline: 23 Nov 2026

TOT Reference No.: 151865887

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Upgrade to the Ftir Microscope, Raman Microscope and Ion Chromatograph Equipment

Deadline: 13 Nov 2026

USA

Deadline: 13 Nov 2026

TOT Reference No.: 151766875

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Deinstallation, Relocation, Reinstallation, Commissioning of the Dualbeam Fib-Sem System - Opex - Pr1262394-3220-P

Deadline: 27 Nov 2026

Germany

Deadline: 27 Nov 2026

TOT Reference No.: 151576532

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Focused Ion Beam Scanning Electron Microscope

Deadline: 10 Nov 2026

South Korea

Deadline: 10 Nov 2026

TOT Reference No.: 151559711

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Lab Training Equipment (Empty Room) High-Precision Focused Ion Beam Scanning Electron Microscope (Foreign Capital)

Deadline: 10 Nov 2026

South Korea

Deadline: 10 Nov 2026

TOT Reference No.: 151547051

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Cmc for Helios 05 Uc (Focused Ion Beam - Scanning Electron Microscope (Fib-Sem))

Deadline: 30 Oct 2026

India

Deadline: 30 Oct 2026

TOT Reference No.: 151068273

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