Government Ion Microscope Online Tenders

Procurement of Field Emission Scanning Electron Microscope/Ion Beam Scanning Electron Microscope Equipment for Peking University Chongqing Institute of Carbon Based Integrated Circuits

Focused Ion Beam Microscope

Purchase of a Plasma-focused ion beam scanning ele

Focused Ion Beam & Scanning Electron Microscope system (FIBSEM) 1 Set

Focused Ion Beam Microscope

Scanning Electron Microscopy System (Se) Equipped with Fib, 3D-Ebsd, 3D-Eds Detectors and Spectrometer for Simultaneous Measuring Spectra for Various Energies, for the Purpose of Analyzing the Light Metal Elements of the Gate ...

Automated CryoUltrathin Section Preparation System with Plasma Focused Ion Beam Scanning Electron Microscope 1 set

Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM)

Supply of a Beam Microscope of Focused Ions (Fib) with Plasma Coupled with a Scanning Electron Microscope Column (Meb)

Purchase of Focused Ion Beam Scanning Electron Microscope