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Global Ion Microscope eprocurement Notices and Bids

TendersOnTime provides latest eprocurement notices for Ion Microscope from various countries. The information on Ion Microscope bids and other public procurement notices is sourced from various sources like: Newspapers, tender bulletin and government online tenders websites.

Focused Ion Beam Scanning Electron Microscope

Deadline: 06 Aug 2025

South Korea

Deadline: 06 Aug 2025

TOT Reference No.: 123352724

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Purchase of Focused Ion Beam Scanning Electron Microscope

Deadline: 06 Aug 2025

South Korea

Deadline: 06 Aug 2025

TOT Reference No.: 123327997

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Aperture Strips and Platinum Sources for Focusing Ion Beams and Electron Beam Microscopes

Deadline: 21 Jul 2025

Taiwan

Deadline: 21 Jul 2025

TOT Reference No.: 122463763

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Automated Cryoultrathin Section Preparation System with Plasma Focused Ion Beam Scanning Electron Microscope 1 Set

Deadline: 30 Jul 2025

Japan

Deadline: 30 Jul 2025

TOT Reference No.: 122325484

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Highperformance Focus Ion Beamscanning Electron Microscope System 1 Set

Deadline: 22 Aug 2025

Japan

Deadline: 22 Aug 2025

TOT Reference No.: 121893011

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Key Components of Double-Beam Focused Ion Beam Microscope, Etc.

Deadline: 22 Jul 2025

Taiwan

Deadline: 22 Jul 2025

TOT Reference No.: 121885881

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Focused Ion Beam & Scanning Electron Microscope System (Fibsem) 1 Set

Deadline: 22 Jul 2025

Japan

Deadline: 22 Jul 2025

TOT Reference No.: 121854563

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Focused Ion Beam Scanning Electron Microscope System

Deadline: 08 Jul 2025

Japan

Deadline: 08 Jul 2025

TOT Reference No.: 121429089

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Focused Ion Beam Scanning Microscope System 1 Set

Deadline: 12 Aug 2025

Japan

Deadline: 12 Aug 2025

TOT Reference No.: 121359124

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System of Scanning Electron Microscope with Focused Ionic Bundle for Sampling for Tomography Atomography

Deadline: 16 Jul 2025

Czech Republic

Deadline: 16 Jul 2025

TOT Reference No.: 121252316

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