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Ultralow Loss Midir Optics with Hybrid Crystalline Tender - 145540578

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Ultralow Loss Midir Optics with Hybrid Crystalline Coatings in the USA. This Tender notice was published on 20 Jul 2026 and is scheduled to close on 23 Jul 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 145540578, while the tender notice number is NIST-SS26-CHIPS-158 and Registering on the platform.

Expired Tender

Procurement Summary

Country: USA

Summary: Ultralow Loss Midir Optics with Hybrid Crystalline Coatings

Deadline: 23 Jul 2026

Posting Date: 20 Jul 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 145540578

Document Ref. No.: NIST-SS26-CHIPS-158

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings
Notice ID: NIST-SS26-CHIPS-158
Contract Opportunity Type: Sources Sought
Response Date: 7/23/26
Product Service Code (PSC): 6640
NAICS Code: 334516
BACKGROUND
The National Institute of Standards and Technology (NIST) is conducting market research to identify alternative sources that (a) are capable of meeting NIST-s minimum requirements for the following commercial products and commercial services and (b) would be interested in competing for that requirement: The CHIPS Metrology Program includes research in Grand Challenge 1, Metrology for Materials Purity, Properties and Provenance. To address this Grand Challenge, the project Optical Impurity Analysis of Semiconductor Gases for Enhanced Quality Systems seeks to purchase Ultralow Loss Mid-IR Optics with Hybrid Crystalline Coatings to perform ultrasensitive cavity ring-down and cavity-enhanced spectroscopy on low-temperature (180 K to 220 K) gas-phase samples. The project is led by the Chemical Science Division of the NIST Material Measurement Laboratory, the nation-s premier metrology laboratory for measurement science, standards, technology, and data in the area of chemical sciences
To improve sensitivity in laser absorption spectroscopy, optical cavities are used to enhance the interaction pathlength between a laser source and a gas-phase sample. Here we aim to detect trace impurities in gas-phase samples relevant to the semiconductor industry. Therefore, we require high reflectivity mirrors with low absorption and scattering loss that efficiently transmit and store laser light. The overall goal is the trace detection of small molecules like carbon dioxide (CO2) and carbon monoxide (CO) in bulk zero gases like CO2, nitrogen (N2) and argon (Ar) at the parts-per-trillion level (1 part in 1012). To achieve this goal, we seek Ultralow Loss Mid-IR...
Notice ID: nist-ss26-chips-158

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: aug 07, 2026

Inactive Policy: 15 days after response date

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