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The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Manual Probe Station in the USA. This Tender notice was published on 30 Jul 2026 and is scheduled to close on 04 Aug 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 146186071, while the tender notice number is NIST-SS26-166 and Registering on the platform.
Procurement Summary
Country: USA
Summary: Manual Probe Station
Deadline: 04 Aug 2026
Posting Date: 30 Jul 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 146186071
Document Ref. No.: NIST-SS26-166
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
NIST-SS26-166
Title: Sources Sought Notice for Manual Probe Station
BACKGROUND
The National Institute of Standards and Technology (NIST) requires a manual probe system with reliable, accurate positioners for tabletop electronic measurements through direct probing of samples. The system shall provide precise motion control for single probe micropositioners, allowing stable electrical contact to small device features such as lithography defined bonding pads. It will be used to screen devices and diagnose possible leakage paths, shorts, or contact issues by room temperature DC measurements before committing time and resources to more advanced measurements. It will also be used to do room temperature RF measurements for testing fabricated RF resonators. the probing precision, DC and RF measurement capability required for our applications.
The National Institute of Standards and Technology (NIST) Material Measurement Laboratory (MML) has a requirement for a Probe Station and is seeking information from sources that may be capable of providing a solution that will achieve the specifications described below:
Description: 200 mm Manual Probe Station with both DC and RF capable micropositioners Quantity: One (1)
Technical specifications.
The system shall have the following components:
a platen where micropositioners sit
an optical microscope
a camera for the microscope
a RF capable chuck to hold the test sample
QTY(4) four micropositioners with probes for DC measurement
QTY(2) two micropositioners with probes for RF measurement.
The probe station shall be designed for RF, DC, and high-power testing applications and shall support multiple probe configurations on a common platen. The platen shall be at least 400 mm x 600 mm in size and support at least a configuration of 2 RF + 4 DC probes.
The system shall come with a vacuum sample chuck with capability to accommodate sample sizes greater than or equal to 200 mm.br...
Notice ID: nist-ss26-166
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Product Service Code: 6640 - laboratory equipment and supplies
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Inactive Dates: aug 19, 2026
Inactive Policy: 15 days after response date
Documents
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