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High Resolution Large Chamber Field Emission Tender - 54444061

The ETH ZURICH has issued a Tender notice for the procurement of a High Resolution Large Chamber Field Emission Electron Microscope and Focused Ion Beam System (crossed Beam System) Eth Zürich Abteilung Finanzdienstleistunge ... in the Switzerland. This Tender notice was published on 24 Jun 2021 and is scheduled to close on 29 Jul 2021, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 54444061, while the tender notice number is 1203727 and Registering on the platform.

Expired Tender

Procurement Summary

Country: Switzerland

Summary: High Resolution Large Chamber Field Emission Electron Microscope and Focused Ion Beam System (crossed Beam System) Eth Zürich Abteilung Finanzdienstleistunge ...

Deadline: 29 Jul 2021

Posting Date: 24 Jun 2021

Other Information

Notice Type: Tender

TOT Ref.No.: 54444061

Document Ref. No.: 1203727

Competition: ICB

Financier: Self Financed

Purchaser Ownership: -

Tender Value: Refer Document

CPV Classification

38000000 - Laboratory, optical and precision equipments (excl. glasses)

Purchaser's Detail

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Tender Details

High Resolution Large Chamber Electronic Field Scanning Microscope and Focused Ion Beam System (Cross-Beam System) Eth Zürich Abteilung Finanzdienstleistungen Einkaufskoordination
Publish Date: 19.06.2021
CPV: 38000000
Type: Call for dealsDeliveropen Procedure
Dead Line: 29.07.2021 23:59
. Object of the market
2.1 Genre of the supplies market: purchase
2.2 Title of the project of the market: high resolution large-resolution high-room field emission scanning microscope and focused ion beam system (cross-beam system)
2.3 Reference / Project Number: PP0106 ​​
2.4 Market divided into lots?: No
2.5 Common vocabulary of public procurement:
2.6 Object and Extensive Market: This instrument combines the power of imaging and analysis of a high-resolution field emission scanning electron microscope (Fe-Sem) with the treatment capabilities of a beam Focused ions (FIB) of new generation. The instrument must be equipped with a high resolution electronic optics and a low voltage FIB to maximize the quality of the sample, even for samples ...

Documents

 Tender Notice


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