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Focused Ion Beam Scanning Electron Microscope Tender - 135447334

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Focused Ion Beam Scanning Electron Microscope Fibsem Instrument in the USA. This Tender notice was published on 10 Feb 2026 and is scheduled to close on 23 Feb 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 135447334, while the tender notice number is 1333ND26QNB030053 and Registering on the platform.

Procurement Summary

Country: USA

Summary: Focused Ion Beam Scanning Electron Microscope Fibsem Instrument

Deadline: 23 Feb 2026

Posting Date: 10 Feb 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 135447334

Document Ref. No.: 1333ND26QNB030053

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
Notice ID: 1333nd26qnb030053

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: mar 10, 2026

Inactive Policy: 15 days after date offers due

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