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The EMPA ZENTRALER EINKAUF has issued a Tender notice for the procurement of a Fib / Tem Ga Focused Ion Beam Instrument and Transmission Electron Microscope in the Switzerland. This Tender notice was published on 20 Jun 2025 and is scheduled to close on 10 Aug 2025, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 121238884, while the tender notice number is 401149-2025 and Registering on the platform.
Procurement Summary
Country: Switzerland
Summary: Fib / Tem Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Deadline: 10 Aug 2025
Posting Date: 20 Jun 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 121238884
Document Ref. No.: 401149-2025
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
38511000 - Electron microscopesPurchaser's Detail
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Login to see detailsTender Details
The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
Doc Title: FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Contract Type: supplies
Document Type: Contract Notice
Contract Type: supplies
Authority Type: body-pl
Doc Title: FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Dispatch Date: 2025-06-19
Publish Date: 2025-06-20
Submission Date: 2025-08-10
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