Combined Sources Sought Notice and Notice Tender in USA - 144964788

Procurement Summary

Country: USA

Summary: Combined Sources Sought Notice and Notice of Intent to Sole Source for Piezoelectric Zstage Upgrade for Optical Microscope

Deadline: 20 Jul 2026

Posting Date: 11 Jul 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 144964788

Document Ref. No.: NIST-SS26-CHIPS-149

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

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Tender Details

***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs. If no alternate sources are identified, the Government intends to issue a Sole Source Award Carl Zeiss Microscopy LLC, 1 N Broadway STE 1501, White Plains, NY 10601-2335 US, under the authority of Revolutionary FAR Overhaul (RFO) FAR 12.102(a). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
BACKGROUND
The National Institute of Standards and Technology (NIST) Microsystems and Nanotechnology Division (MND) develops integrated microsystems by advancing the state of the art in nanofabrication, enabling the transfer of NIST measurement technologies to the industrial, academic, and government communities. The MND owns two Zeiss Axio Observer microscopes that serve CHIPS Metrology project GC6.01 - Universal Microscopy Standards. To meet mission-critical requirements, the MND needs to procure a piezoelectric z-stage upgrade for one of these microscopes. This acquisition will provide the Division and CHIPS Metrology with essential capabilities for calibration and measurement method development, assessment of nanofabrication processes, and characterization of microscopy
NIST is developing traceable standards for calibrating microscopy systems, including optical microscopes, scanning-electron microscopes, and atomic-force microscopes. A key component of this process is traceable optical microscopy to rapidly characterize standards and establish traceable critical dimensions, enabling the transfer of traceability from the NIST line-scale interferometer (LSI) to other microscopies. Current efforts have established that such characterization, scale calibration in particular, is sensitive to sample positioning in...
Notice ID: nist-ss26-chips-149

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: aug 04, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice