Combined Sources Sought Notice and Notice Tender in USA - 146509229

Procurement Summary

Country: USA

Summary: Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for Xray Computed Tomography Microscope

Deadline: 18 Aug 2026

Posting Date: 04 Aug 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 146509229

Document Ref. No.: NIST-AMD-NOISSN-26-30500006

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

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Tender Details

Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for X-ray Computed Tomography Microscope
Notice ID: NIST-AMD-NOISSN-26-30500006
Contract Opportunity Type: Sources Sought
Response Date: August 18, 2026 at 11:00 AM ET
Product Service Code (PSC): 6650 - Optical Instruments, Test Equipment, Components and Accessories
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing, with the small business size standard of 1, 000 Employees
BACKGROUND
The National Institute of Standards and Technology (NIST) is conducting market research to identify alternative sources that (a) are capable of meeting NIST-s minimum requirements for the following commercial products and commercial services and (b) would be interested in competing for that requirement:
The Precision Imaging Facility at the National Institute of Standards and Technology (NIST) is involved in the characterization of metals, semiconductors, and insulators in support of multiple projects. Materials characterization allows NIST scientists to make direct correlations between material processing, (nano)structure, and resulting properties. This work involves the correlation of processing, structure, and properties of semiconductor material devices using three-dimensional X-ray computed tomography (XCT). Consistent with NIST-s mission to develop measurement science, a particular research focus is to evaluate the sources of systematic and statistical error that limit the efficacy of XCT techniques, to devise strategies to mitigate these uncertainties, and to develop metrics that quantify the results.
The NIST PIF owns and performs research using a Zeiss Versa XRM 500 microscope system. The system is now over ten years old and is no longer eligible for technical service support from the manufacturer or any third parties. NIST now requires a new XCT microscope for micro-scale three-dimensional imaging of semiconductor materials and devices. The new micros...
Notice ID: nist-amd-noissn-26-30500006

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6650 - optical instruments, test equipment, components and accessories

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: sep 02, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice