Combined Sources Sought Notice and Notice Tender in USA - 146652268

Procurement Summary

Country: USA

Summary: Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for Scanwave Pro Electronic Controller for a Vero Afm

Deadline: 12 Aug 2026

Posting Date: 06 Aug 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 146652268

Document Ref. No.: NB643090-26-01166

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

Name: Login to see tender_details

Address: Login to see tender_details

Email: Login to see tender_details

Login to see details

Tender Details

BACKGROUND
The National Institute of Standards and Technology (NIST) is conducting market research to identify alternative sources that (a) are capable of meeting NIST-s minimum requirements for the following commercial products and commercial services and (b) would be interested in competing for that requirement:
NIST requires one (1) scanning Microwave Impedance Microscopy (sMIM) electronic controller to support nanoscale impedance property measurements for research conducted by Division 643. The required controller will integrate with the Government-owned Vero Atomic Force Microscope (AFM) through the existing ScanWave 2.0™ Probe Interface module and will replace the current modular assembly consisting of a microwave electronics unit, power supply, temperature controller, and reflectometer calibrator.
The required system shall provide enhanced nanoscale impedance characterization capabilities while maintaining compatibility with the Government's existing Vero AFM configuration. The controller must support direct impedance measurements of material samples and enable integration of electrical characterization with the Vero AFM's existing multimodal measurement capabilities, including current, surface potential, capacitance, piezoelectric, thermal, and mechanical (elastic and plastic) characterization techniques.
At a minimum, the required electronic controller shall:
Be fully compatible with the Government-owned Vero AFM and the existing ScanWave 2.0™ Probe Interface module without requiring replacement or modification of the existing interface.
Provide scanning Microwave Impedance Microscopy (sMIM) capability for direct nanoscale impedance measurements.
Replace the existing modular microwave electronics assembly with a single integrated electronic controller.
Provide substantially improved measurement sensitivity over the existing measurement configuration (approximately a tenfold increase in sensitivity).
Integrate with the existin...
Notice ID: nb643090-26-01166

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6625 - electrical and electronic properties measuring and testing instruments

NAICS Code: 334515 - Instrument Manufacturing for Measuring and Testing Electricity and Electrical Signals

Inactive Dates: aug 13, 2026

Inactive Policy: manual

Documents

 Tender Notice