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The HELMHOLTZ-ZENTRUM DRESDEN-ROSSENDORF E.V. has issued a Tender notice for the procurement of a Spectroscopic Imaging Ellipsometer (Es) with Atomic Force Microscope (Afm) in the Germany. This Tender notice was published on 14 Jan 2026 and is scheduled to close on 12 Feb 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 133652771, while the tender notice number is 26077-2026 and Registering on the platform.
Procurement Summary
Country: Germany
Summary: Spectroscopic Imaging Ellipsometer (Es) with Atomic Force Microscope (Afm)
Deadline: 12 Feb 2026
Posting Date: 14 Jan 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 133652771
Document Ref. No.: 26077-2026
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Delivery, installation and on-site acceptance test of a spectroscopic imaging ellipsometer (ES) integrated with atomic force microscope (AFM)Award of contract for the delivery, installation and on-site acceptance test of a spectroscopic imaging ellipsometer (ES) integrated with atomic force microscope (AFM) Spectroscopic imaging ellipsometer (ES) with atomic force microscope (AFM) At the Institute of Ion Beam Physics and Materials Research within the department Magnetism at the Helmholtz-Zentrum Dresden-Rossendorf a spectroscopic imaging ellipsometer (ES) integrated with atomic force microscope (AFM) is to be procured. The integration of the ES with AFM is crucial for the further experiments. The system must provide a unique possibility to investigate the optical, magnetic and structural properties of different nanostructured materials including classical semiconductors and 2D materials. In addition, the surface morphology can be determined. The integration of ES with AFM allows easy access to the same investigated field and is especially important for nanowires, 2D materials and other nano-objects. The ES should be equipped with imaging variable angle spectroscopy system with imaging detection system in the spectral range between 190 and 1700 nm. The instrument must give the values as well as microscopic maps and histograms of Delta and Psi with a lateral resolution better than 2 µm. Moreover, the instrument must be able to show ellipsometric contrast live view of the sam...
Document Type: Contract Notice Reference Number: EUOV2514 Contract Type: supplies Authority Type: pub-undert-cga Doc Title: Spectroscopic imaging ellipsometer (ES) with atomic force microscope (AFM) Dispatch Date: 2026-01-12 Publish Date: 2026-01-14 Submission Date: 2026-02-12
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