Procurement Summary
Country: Germany
Summary: Secondary Ion Mass Spectrometer (Sims) - Pr1195891-2050-W
Deadline: 23 Sep 2026
Posting Date: 24 Aug 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 147823729
Document Ref. No.: 583241-2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
42990000 - Miscellaneous special-purpose machinery
Purchaser's Detail
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Tender Details
Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
1 pc. The objective is to procure a highly sensitive SIMS instrument for depth‑profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. The system shall enable precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, with a focus on characterizing advanced III‑V and diamond‑based device structures and epitaxial layers, including 150 mm substrates, to support process development, quality control and optimization at Fraunhofer IAF.
Doc Title: Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
Contract Type: supplies
Document Type: Contract Notice
Reference Number: PR1195891-2050-W
Contract Type: supplies
Authority Type: pub-undert
Doc Title: Secondary ion mass spectrometer (SIMS) - PR1195891-2050-W
Dispatch Date: 2026-08-21
Publish Date: 2026-08-24
Submission Date: 2026-09-23
Documents
Tender Notice