Procurement Summary
Country: Oman
Summary: Scanning Electron Microscope, Oty: 1
Deadline: 28 Jul 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 122339185
Document Ref. No.: 1234/25/0095
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Category : Equipments
SQU Product Code : EQUANAMIC0002
Description : SCANNING ELECTRON MICROSCOPE
Quantity : 1
Remark : [EQUANAMIC0002] SCANNING ELECTRON MICROSCOPE-Scanning Electron Microscope:Important Note: In your offer submit an additional attachment mentioning the following requirements in the same order and numbering. Beside each specification, mention the compatibility of the required specification/term with your offered model and also mention the location of the related information in your offer. (PROVIDED? [ Page: ( ), Item Reference.: ( ) ] // REGRET? )Scanning Electron microscope with the following minimum requirements: 1.Electron Gun and Optics:1.1. High Resolution Schottky Field Emission1.2.Must has specific modes to scan and observe wet, oily or dusty samples.1.3.Fixed objective aperture.1.4.Magnification: reaching 1000000x1.5. Automated beam alignment1.6.Automated focus.1.7.Automated astigmatism correction.2.Accelerating Voltage : 500v to 30kv continuously adjustable.3.Probe current: 200 nA or better, continuously adjustable.4.Beam Deceleration Range: user selectable, continuously adjustable.5.Operational Mode & Resolution: With Seamless transition between vacuum modes5.1.High vacuum Mode: up to 1.0 nm at 30 kV (SE) and up to 3.0 nm at 1kV (SE)5.2.Low vacuum Mode 1.4 nm at 30 kV (SE), 2.5 nm at 30 kV (BSE) and 4.0 nm at 3 kV (SE)6.Peltier stage: Software controlled Peltier/heat- cold stage or alternative. 7.Other Detectors with Basic System: 7.1. Everhardt Thornley SED (secondary electron detector)7.2. Field Low vacuum SED (LFD) or alternative7.3.Backscattered Electron Detector.7.4. STEM detector to be quoted as an option.7.5.IR CCD camera for the stage.8.Specimen Stage: x-Y = 100 mm or more/Z = 40 mm or more/T = - 10 to + 90 /R = 360 continuous9.Sample size: should accept samples of 200 mm diameter or more and thickness of 50 mm or more.10.Sample Holders : 10.1. Multi-stub holder 10.2.Multiple specimen ...
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