Rasterelektronenmikroskop - Pr1253394-2790-W Tender - 146578671

Procurement Summary

Country: Germany

Summary: Rasterelektronenmikroskop - Pr1253394-2790-W

Deadline: 07 Sep 2026

Posting Date: 05 Aug 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 146578671

Document Ref. No.: 540796-2026

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

CPV Classification

38511100 - Scanning electron microscopes

Purchaser's Detail

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Tender Details

Rasterelektronenmikroskop - PR1253394-2790-W
1 Piece Scanning electron microscopy (SEM) is a widely used analytical tool for materials analysis, combining non-destructive, user-friendly operation with extensive possibilities for materials characterisation. In addition to imaging of material surfaces, SEM enables a variety of spectroscopic and diffraction-based methods for analysing chemical composition, crystallographic properties and structural defects. With a field-emission SEM (FE-SEM), a broad magnification range can be accessed, extending to sub-nanometre resolution. As a leading institute in the field of (ultra-)wide bandgap materials, we require an SEM that supports a broad range of materials-science characterisation tasks. These includes, in particular, the characterisation of (ultra-)wide band gap bulk crystals, fine-grained source materials, raw substrates with respect to intrinsic defects and residual damages e.g. from polishing processes, substrates with epitaxial layers for (opto-) electronic devices and fully processed device wafers. The key requirements for the intended SEM can be grouped into three main aspects: 1) An electron optical system providing state-of-the-art high lateral resolution down to the sub-nanometre range. This must be combined with a comprehensive detector set, including chamber-detectors for secondary (SE) and backscattered (BSE) electrons, as well as In-lens detectors for both SE and BSE electrons, with selectable energy ranges and cle...
Document Type: Contract Notice

Reference Number: PR1253394-2790-W

Contract Type: supplies

Authority Type: pub-undert

Doc Title: Rasterelektronenmikroskop - PR1253394-2790-W

Dispatch Date: 2026-08-03

Publish Date: 2026-08-05

Submission Date: 2026-09-07

Documents

 Tender Notice