Procurement Summary
Country: Germany
Summary: Prior Information Notice - Rf Measurement System for On-Wafer Characterisation
Deadline: 27 Jul 2026
Posting Date: 12 Jun 2026
Other Information
Notice Type: Procurement Plan/GPN/PIN
TOT Ref.No.: 143170406
Document Ref. No.: 404150-2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: EUR 650000
CPV Classification
42990000 - Miscellaneous special-purpose machinery
Purchaser's Detail
Name: Login to see tender_details
Address: Login to see tender_details
Email: Login to see tender_detailsLogin to see details
Tender Details
Prior Information Notice - RF Measurement System for On-Wafer Characterisation The Ferdinand-Braun-Institut (FBH) plans to procure a high-frequency RF measurement system for on-wafer characterisation within the framework of the EU-funded APECS programme. The system will be used for the electrical characterisation of semiconductor devices, circuits and demonstrators, including single-ended and differential measurements in the mmWave frequency range. It is intended to support advanced heterointegration processes and ensure reliable and high-quality measurement results. The equipment shall enable automated, high-precision measurements and provide a versatile platform for RF analysis, including network and spectrum measurements. It will be integrated into existing cleanroom and measurement environments. The procurement procedure is planned for 2026. Doc Title: Prior Information Notice - RF Measurement System for On-Wafer Characterisation Contract Type: supplies
Document Type: Prior Information Notice Reference Number: FBH‑06.4.2 (RF Measurement System) Contract Type: supplies Estimated Value: 650000 - EUR Authority Type: la Doc Title: Prior Information Notice – RF Measurement System for On-Wafer Characterisation Dispatch Date: 2026-06-10 Publish Date: 2026-06-12 Submission Date: 2026-07-27
Documents
Tender Notice