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The FRAUNHOFER-GESELLSCHAFT - EINKAUF B12 has issued a Tender notice for the procurement of a Nano-Xct Inspection Tool (Imws-04.1) - Pr924099-2690-P in the Germany. This Tender notice was published on 02 Jun 2026 and is scheduled to close on 02 Jul 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 142449544, while the tender notice number is 377744-2026 and Registering on the platform.
Procurement Summary
Country: Germany
Summary: Nano-Xct Inspection Tool (Imws-04.1) - Pr924099-2690-P
Deadline: 02 Jul 2026
Posting Date: 02 Jun 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 142449544
Document Ref. No.: 377744-2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
38126000 - Surface observing apparatusPurchaser's Detail
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Email: Login to see tender_detailsLogin to see details Tender Details nano-XCT inspection tool (IMWS-04.1) - PR924099-2690-P Documents
1 Piece Nano-XCT Inspection Tool The Fraunhofer Institute for Microstructure of Materials and Systems IMWS investigates the application behavior, reliability, safety, and service life of innovative materials in components and systems. The "Electronic Materials and Components" division of Fraunhofer IMWS supports industry and research partners with its internationally recognized expertise in the field of failure analysis of electronic components. Fraunhofer IMWS will expand its competencies in advanced failure analysis and material characterization to support the ramp-up of new technologies for heterogeneous integration and to address the challenges related to manufacturing and reliability. To enable the non-destructive detection and evaluation of structural deviations, contact defects, and damage characteristics, as well as their precise localization within the package—thus creating the basis for further high-resolution physical diagnostics—the use of the latest generation of X-ray microscopy (XRM) systems is required. The instrument should offer the capability to use various target materials in combination with microscope optics and different detector technologies to resolve the submicroscopic structure and heterogeneous material combinations of QMI and 2.5/3D devices. The option to expand the system with a second X-ray source for imaging materials with low absorption would be a valuable addition, enabling the analys...
Document Type: Contract Notice
Reference Number: PR924099-2690-P
Contract Type: supplies
Authority Type: pub-undert
Doc Title: nano-XCT inspection tool (IMWS-04.1) - PR924099-2690-P
Dispatch Date: 2026-06-01
Publish Date: 2026-06-02
Submission Date: 2026-07-02
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