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The FRAUNHOFER SOCIETY FOR THE PROMOTION OF APPLIED RESEARCH E. V. has issued a Tender notice for the procurement of a Inline Automatic Optical Inspection (Aoi) with High-Speed Analysis for Qmi Systems in the Germany. This Tender notice was published on 20 Feb 2026 and is scheduled to close on 02 Mar 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 136213821, while the tender notice number is 120586-2026 and Registering on the platform.
Procurement Summary
Country: Germany
Summary: Inline Automatic Optical Inspection (Aoi) with High-Speed Analysis for Qmi Systems
Deadline: 02 Mar 2026
Posting Date: 20 Feb 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 136213821
Document Ref. No.: 120586-2026
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
Modular, fully automated prober for optical inspection and electrical contact of electronic, photonic and mi-cro‑mechanical devices — including advanced manufacturing approaches such as quasi‑monolithic integration. The system handles 200 mm wafers as well as frames, tapes, trays and comparable substrates. An end‑to‑end carrier handling system loads carriers with mounted substrates from specialized cassettes, positions them on the prober's vacuum chuck and performs fully automated alignment. A testcard/probe‑card interface is provided for electrical connection. Probe detection and fine positioning are performed automatically to ensure reproducible contact conditions. The control software supports program-mable sequence control and reference‑point based alignment. For optical inspection the system offers a movable mechanical interface to accept modular, customer‑supplied optical inspection modules (e.g., microscope with camera) with lateral and vertical adjustment. The space above the p Inline automatic optical inspection (AOI) with high-speed Analysis for QMI systems Modular, fully automated prober for optical inspection and electrical contact of electronic, photonic and mi-cro‑mechanical devices — including advanced manufacturing approaches such as quasi‑monolithic integration. The system handles 200 mm wafers as well as frames, tapes, trays and comparable substrates. An end‑to‑end carrier handling system loads carriers with mounted substrates from specialized cassettes, pos...
Document Type: Contract Notice Reference Number: PR1059709 Contract Type: supplies Authority Type: pub-undert Doc Title: Inline automatic optical inspection (AOI) with high-speed Analysis for QMI systems Dispatch Date: 2026-02-19 Publish Date: 2026-02-20 Submission Date: 2026-03-02
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