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The IHP GMBH - LEIBNIZ INSTITUTE FOR INNOVATIVE MICROELECTRONICS has issued a Tender notice for the procurement of a 200 Mm Semi-Automatic Rf Probe System for On-Wafer Measurements up to 250 Ghz in the Germany. This Tender notice was published on 25 Jun 2026 and is scheduled to close on 24 Jul 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 143991387, while the tender notice number is 432100-2026 and Registering on the platform.
Procurement Summary
Country: Germany
Summary: 200 Mm Semi-Automatic Rf Probe System for On-Wafer Measurements up to 250 Ghz
Deadline: 24 Jul 2026
Posting Date: 25 Jun 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 143991387
Document Ref. No.: 432100-2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
38341300 - Instruments for measuring electrical quantitiesPurchaser's Detail
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Email: Login to see tender_detailsLogin to see details Tender Details 200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz 200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz - Semi-automated 200 mm probe system for on-wafer measurements - Integrated controlled dry atmosphere to prevent condensation and ice formation during measurements below ambient temperature - System design with a defined interface architecture enabling integration of optional thermal chucks through standardized mechanical, electrical, and software interfaces - Automatic wafer size recognition (150 mm, 200 mm wafers and individual dies down to 5 × 5 mm) - Precision XY stage: minimum travel range 310 × 310 mm, repeatability - Precision Z stage: minimum travel range 30 mm, repeatability - Theta axis: ±5°, resolution ? 0.0001° - Controlled contact mechanism with repeatability ? 1 µm - Integrated vibration isolation and leveling table - Central operator console for control of all axes and system functions - Integrated keyboard and mouse tray - Power supply: 100-240 V AC, 50/60 Hz Doc Title: 200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz Contract Type: supplies Documents
Document Type: Contract Notice Reference Number: IHP-2026-033 Contract Type: supplies Authority Type: org-sub Doc Title: 200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz Dispatch Date: 2026-06-23 Publish Date: 2026-06-25 Submission Date: 2026-07-24
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Refer Document
Procurement Documents for Germany
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