x -Ray Diffraction Equipment, Mainly for Thin Layer Polycrystalline Materials Tender

Procurement Summary

Country : Spain

Summary : x -Ray Diffraction Equipment, Mainly for Thin Layer Polycrystalline Materials

Deadline : 18 Jun 2025

Other Information

Notice Type : Tender

TOT Ref.No.: 120297416

Document Ref. No. : 359786-2025

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : EUR 350000

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Tender Details

The manufacturing capabilities of materials and devices at micro/nanometric scale in 8 "wafers of the Nanophotonic Technology Institute are not only notable, but are currently extending significantly to reach a superlative level in Spain and Europe. Within the framework of thisCapacity extension, which also includes new characterization techniques, one of the peremptory needs of the institute is the rapid compositional characterization of layers of crystalline materials, opitaxial floods or by other manufacturing techniques, which also allows detectingThe presence of structural defects, textures, and even the presence of a certain degree of management (atomic or pores).Base of the x -ray diffraction phenomenon (DRx) by solids in a crystalline state. To summarize the functioning of this phenomenon, when the subject under study is irradiated by x -rays, these are diffracted by the electrons surrounding the atoms, because its wavelength is from thesame order of magnitude as the atomic radius of the material. The emerging x -ray beam after this interaction contains information about the position and type of atoms found in its path. In the case of crystalline materials, thanks to their periodic structure, they disperse elasticallylo...
Document Type: Contract Notice

Reference Number: MY25/IUTNA/S/22

Contract Type: Supplies

Estimated Value: 350000-Eur

Authority Type: Body-PL-RA

Doc Title: x-ray diffraction equipment, mainly for polyristal materials in thin layer

Dispatch Date: 2025-06-03

Publish Date:2025-06-04

Submission Date: 2025-06-18

Documents

 Tender Notice