Procurement Summary
Country: Finland
Summary: Wafer Metrology
Deadline: 29 May 2026
Posting Date: 27 Apr 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 140222847
Document Ref. No.: REF.NO. 11/206/2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
The object of the tender is semi-automatic wafer metrology tool (later also “tool”) for measurement of total thickness, TTV (total thickness variation), warp, bow, metallization bumps, trench or via depth and geometric factors in substrates typical in semiconductor industry such as but not limited to silicon wafers, chips, stacked wafers, stacked chips, samples containing mixed oxides, or/and thin materials deposited.The tool must be compatible with installation in an ISO 4 classified cleanroom. The object of the tender process is described in more detail in the invitation to tender documents.
Published: 26/04/2026 Deadline for submitting questions: 11/05/2026 Deadline for tenders: 29/05/2026
Documents
Tender Notice