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The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Vector Network Analyzer in the USA. This Tender notice was published on 09 Dec 2025 and is scheduled to close on 15 Dec 2025, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 131700508, while the tender notice number is NIST-SS26-CHIPS-36 and Registering on the platform.
Procurement Summary
Country: USA
Summary: Vector Network Analyzer
Deadline: 15 Dec 2025
Posting Date: 09 Dec 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 131700508
Document Ref. No.: NIST-SS26-CHIPS-36
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
NIST-SS26-CHIPS-36
PLEASE NOTE THIS A SOURCES SOUGHT NOTICE ONLY
Title: Vector Network Analyzer
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
This SOW describes equipment needed for a project “RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching”, which is part of the CHIPS metrology program-s Grand Challenge 5, “Modeling/Simulating Semiconductor Manufacturing Processes”. The equipment will be purchased by NIST-s RF Technology Division. Part of the mission of the RF technology division is to develop techniques for fundamental electromagnetic metrology.
In this case, the research project “RF Waveform and Rapid Frequency-Comb Diagnostics for Plasma Etching” focuses on high-power waveform metrology. High-power RF waveforms are used in semiconductor plasma processing, including etching and deposition processes. These processing steps are very common in semiconductor manufacturing. The characteristics of the waveforms impact the quality of the resulting chips. But industry lacks the ability to accurately measure these waveforms. We aim to close that gap by developing high-power waveform measurement techniques.
One of the key tools for our approach to waveform metrology is a Vector Network Analyzers (VNA). The VNA will be used to characterize the measurement system, including the waveguides, couplers, connectors, and other components that complicate the interpretation of radiofrequency (RF) measurements. This characterization will be accomplished by well-established techniques such as the Sh...
Notice ID: nist-ss26-chips-36
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Inactive Dates: dec 30, 2025
Inactive Policy: 15 days after response date
Documents
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