Upol/Přf/Kef - Fib-Sem System Including Tender - 145820983

Procurement Summary

Country: Czech Republic

Summary: Upol/Přf/Kef - Fib-Sem System Including Analytical Techniques and Nanoindentation

Deadline: 26 Aug 2026

Posting Date: 24 Jul 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 145820983

Document Ref. No.: 513059-2026

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: CZK 31452000

CPV Classification

38511100 - Scanning electron microscopes
38512100 - Ion microscopes
38433000 - Spectrometers
38433100 - Mass spectrometer

Purchaser's Detail

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Tender Details

UPOL/PřF/KEF - FIB-SEM system including analytical techniques and nanoindentation The subject of the Public Contract is the supply of a FIB-SEM (scanning electron microscope with an ion beam) microscopic system with the possibility of depositing at least three materials (platinum, carbon, tungsten) and with subsequent analytical techniques for detailed analysis of the studied materials (4DSTEM, EBSD, EDS, Nanoindentation, TOF-SIMS). The minimum requirements for the subject of Public procurement are defined by technical, commercial or other contractual conditions, which are attached to the Tender Documentation. In particular, the Technical Specification and the binding text of the contract. Doc Title: UPOL/PřF/KEF - FIB-SEM system including analytical techniques and nanoindentation Contract Type: supplies
Document Type: Contract Notice Contract Type: supplies Estimated Value: 31452000 - CZK Authority Type: body-pl-cga Doc Title: UPOL/PřF/KEF - FIB-SEM system including analytical techniques and nanoindentation Dispatch Date: 2026-07-23 Publish Date: 2026-07-24 Submission Date: 2026-08-26

Documents

 Tender Notice