Ultrahigh Vacuum Uhv Translation Stages Tender in USA - 148149442

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Ultrahigh Vacuum Uhv Translation Stages in the USA. This Tender notice was published on 29 Aug 2026 and is scheduled to close on 08 Sep 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 148149442, while the tender notice number is NIST-SSN-26-3002508 and Registering on the platform.

Expired Tender

Procurement Summary

Country: USA

Summary: Ultrahigh Vacuum Uhv Translation Stages

Deadline: 08 Sep 2026

Posting Date: 29 Aug 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 148149442

Document Ref. No.: NIST-SSN-26-3002508

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Background
The National Institute of Standards and Technology (NIST) is embarking on a project to support the Extreme Ultraviolet Lithography (EUVL) community by developing characterization of EUV scintillator materials. Many techniques for measuring spatial distribution (or image) of EUV rely on scintillators or devices that convert EUV radiation into visible light. Scintillators tend to be robust and afford the user the ability to use less costly and easier to characterize, visible light detection or imaging systems. However, their characterization requires specialized techniques and hardware which NIST must develop in order to provide accurate characterization of the performance of EUV scintillators.
This requirement supports the “Optical Metrology for EUV Generation” Project under Grand Challenge 2, “Advanced Metrology for Future Microelectronics Manufacturing, ” for CHIPS R&D Metrology. This requirement enables NIST to construct an ultra-high vacuum microscope to operate in NIST Synchrotron Ultraviolet Research Facility (SURF III) EUV reflectometer beamline. The microscope will allow for the measurement of EUV scintillator efficiency, output spectrum and point spread function.
Minimum Capabilities that NIST Requires and for Which Information is Being Requested
DRAFT MINIMUM REQUIREMENTS
Description: UHV translation stages
Quantity: 10
Technical Specifications
Ultra-high vacuum compatible: low-outgassing materials, pressure range 10-8 Torr or better:
Polyimide or PTFE insulated wire cables with braided, silver-plated copper shielding.
All Stainless steel (18-8 or similar) hardware and plain finish materials (no anodization or paint).
Stainless steel bearings lubricated with UHV-compatible lubricants (10-9 Torr or better rated at room temperature, no silicone-based lubricants)
Vented holes or vented hardware used in unvented blind holes.
Minimum bake out temperature 100°C.
Travel Range: 50 mm minimum, 55 mm...
Notice ID: nist-ssn-26-3002508

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: sep 23, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice

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