Tip Station Equipment ("Probe System") for Automatic Temperature Optical, Dc and... Tender

Procurement Summary

Country: Spain

Summary: Tip Station Equipment ("Probe System") for Automatic Temperature Optical, Dc and Rf Characterization for 8" Wafers

Deadline: 04 Nov 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 128586147

Document Ref. No.: 692132-2025

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: EUR 572000

Purchaser's Detail

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Tender Details

The Institute of Nanophotonic Technology (NTC) of the UPV proposes the acquisition of semi-automatic hybrid electro-optical characterization equipment, with a capacity of up to 110GHz in a temperature range of -40 degrees to 200 degrees. and testing of electronic and photonic devices created in the center's own facilities (clean room) or providing device services external. allows test circuits from a few millimeters in size to full 8-inch wafers) simultaneously in the optical spectrum (1300nm and 1550nm) and radio spectrum (DC to 110 GHz and applying extreme temperatures depending on the regulations that the device under test must comply with.

This team will focus on testing the final functionality of RF and/or photonic circuits included in microprocessors and chips, lasers, modulators and photodetectors for high-speed telecommunications systems, or the testing of advanced circuits for space and defense issues, since the The thermal range it covers is a requirement in many current regulations.

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Document Type: Contract Notice
Reference Number: MY25/IUTNA/S/62
Contract Type: supplies
Estimated Value: 572000 - EUR
Authority Type: body-pl-ra
Doc Title: Tip station equipment ("PROBE SYSTEM") for automatic temperature optical, DC and RF characterization for 8" wafers
Date: 2025-10-20
Publish Date: 2025-10-21
Submission Date: 2025-11-04

Documents

 Tender Notice