Procurement Summary
Country : Spain
Summary : Supply and Installation of an Electronic Scanning Microscope (Focused Ion Beam), x -Ray Analysis System and Mass Ablation System of Material by Clustered Laser, Destined ...
Deadline : 14 Jul 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 120686093
Document Ref. No. : 377443-2025
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : EUR 1700000
Purchaser's Detail
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Supply and installation of an electronic scanning microscope (Focused Ion Beam), x -ray analysis system and mass ablation system of material by clustered laser, destined ...
As indicated in the justification memory of the technical specifications, in memory justification of the need to hire, and in the specifications of technical prescriptions.
Supply and installation of an electronic scanning microscope (Focused Ion Beam), x -ray analysis system and massive material ablation system by clusted laser, intended for the institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
Doc Title: Supply and installation of an electronic scanning microscope with FIB (Focused Ion Beam), x -ray analysis system and massive material ablation system by clusing laser, destined for the Institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
Contract Type: Supplies
Document Type: Contract Notice
Reference Number: 33622/25
Contract Type: Supplies
Estimated Value: 1700000 - EUR
Authority Type: Body-P-CGA
DOC Title: Supply and installation of an electronic FIB scanning microscope (Focused Ion Beam), x -ray analysis system and ablation system Massive material through pulsed laser, intended for the Institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
Dispatch Date: 2025-06-10
Publish Date: 2025-06-11
Submission Date: 2025-07-14
Documents
Tender Notice