Procurement Summary
Country : Japan
Summary : Scanning Electron Microscope for Cryoelectron Tomography 1 Set
Deadline : 27 Apr 2023
Other Information
Notice Type : Tender
TOT Ref.No.: 80886394
Document Ref. No. :
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
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Scanning Electron Microscope for CryoElectron Tomography 1 Set
Classification :
0024 Professional/Scientific & Controlling Instruments & Apparatus
Summay of Notice :
⑴ Classification of the products to be procured : 24
⑵ Nature and quantity of the products to be purchased : Scanning Electron Microscope for Cryo-Electron Tomography 1 Set
⑶ Type of the procurement : Purchase
⑷ Basic requirements of the procurement :
① Cryo Focused ion beam-Scanning electron microscope (FIB-SEM)
1) Focused ion beam with a liquid gallium ion source should be equipped for fine milling.
2) An in-lens-type thermal Schottky field emission gun should be equipped, and the emitter should be worked without the need of exchange for more than 3 years.
3) The retractable reflected electron detector located just below the SEM column can be inserted, when the stage is tilted by 50 degree or more at the coincident point.
4) The temperature of the cryo-stage should be controllable at the range from -150℃ to 20℃ using liquid nitrogen.
② Light microscope for cryo-correlative microscopy
1) The cryo-stage cooled by liquid nitrogen should be equipped.
2) The bright field images can be overlapped with the fluorescence images.
3) The objective lens with 100 times magnification or higher should be equipped.
③ Coordinate linkage system This system is necessary for obtaining cryo-electron tomography images using the 300kV transmission electron microscope (CRYO ARM 300 II, JEOL), ...
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