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Scanning Electron Microscope Tender in Denmark - 144062897

The DANMARKS TEKNISKE UNIVERSITET - DTU has issued a Tender notice for the procurement of a Scanning Electron Microscope in the Denmark. This Tender notice was published on 26 Jun 2026 and is scheduled to close on 31 Aug 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 144062897, while the tender notice number is 439187-2026 and Registering on the platform.

Expired Tender

Procurement Summary

Country: Denmark

Summary: Scanning Electron Microscope

Deadline: 31 Aug 2026

Posting Date: 26 Jun 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 144062897

Document Ref. No.: 439187-2026

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

CPV Classification

38511000 - Electron microscopes

Purchaser's Detail

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Tender Details

Scanning Electron Microscope
This tender concerns the acquisition of a scanning electron microscope (SEM) for a university facility that provides access to an extensive suite of nanofabrication and characterisation tools as one of its core purposes. Due to a recently identified bottleneck in the suite of high-end characterisation in the cleanroom, DTU wishes to acquire a SEM. This problem has arisen as the result of multiple breakdowns among the aging and current instruments thus exposing an unexpected vulnerability in the overall process flow of several of our commercial users. The instrument is intended to meet the characterization requirements of DTU-s key commercial customers. Accordingly, only a high-end system equipped with a field emission source, capable of delivering high emission at low energy spread, will be considered acceptable. The system must provide state-of-the-art lateral image resolution of 0.8 nm or better at an accelerating voltage of 15 kV, and 0.9 nm or better at 1 kV, both achieved without beam deceleration or sample bias and using the in-column secondary electron detector. The SEM must be compatible with samples originating directly from customer production processes and must therefore be capable of handling wafers with diameters of up to 200 mm. Typical substrate materials include silicon, fused silica, and quartz. These materials cannot be coated to reduce charging effects during SEM analysis, and the instrument must therefore be capable of ima...
Document Type: Contract Notice

Reference Number: 11134

Contract Type: supplies

Authority Type: body-pl

Doc Title: Scanning Electron Microscope

Dispatch Date: 2026-06-23

Publish Date: 2026-06-26

Submission Date: 2026-08-31

Documents

 Tender Notice


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