Procurement Summary
Country: Denmark
Summary: Scanning Electron Microscope
Deadline: 31 Aug 2026
Posting Date: 26 Jun 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 144062897
Document Ref. No.: 439187-2026
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
38511000 - Electron microscopes
Purchaser's Detail
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Login to see detailsTender Details
Scanning Electron Microscope
This tender concerns the acquisition of a scanning electron microscope (SEM) for a university facility that provides access to an extensive suite of nanofabrication and characterisation tools as one of its core purposes. Due to a recently identified bottleneck in the suite of high-end characterisation in the cleanroom, DTU wishes to acquire a SEM. This problem has arisen as the result of multiple breakdowns among the aging and current instruments thus exposing an unexpected vulnerability in the overall process flow of several of our commercial users. The instrument is intended to meet the characterization requirements of DTU-s key commercial customers. Accordingly, only a high-end system equipped with a field emission source, capable of delivering high emission at low energy spread, will be considered acceptable. The system must provide state-of-the-art lateral image resolution of 0.8 nm or better at an accelerating voltage of 15 kV, and 0.9 nm or better at 1 kV, both achieved without beam deceleration or sample bias and using the in-column secondary electron detector. The SEM must be compatible with samples originating directly from customer production processes and must therefore be capable of handling wafers with diameters of up to 200 mm. Typical substrate materials include silicon, fused silica, and quartz. These materials cannot be coated to reduce charging effects during SEM analysis, and the instrument must therefore be capable of ima...
Document Type: Contract Notice
Reference Number: 11134
Contract Type: supplies
Authority Type: body-pl
Doc Title: Scanning Electron Microscope
Dispatch Date: 2026-06-23
Publish Date: 2026-06-26
Submission Date: 2026-08-31
Documents
Tender Notice