Plasma Fib/Sem for Room-Temperature and Cryogenic Tender - 138153315

Procurement Summary

Country: Switzerland

Summary: Plasma Fib/Sem for Room-Temperature and Cryogenic Applications

Deadline: 20 Apr 2026

Posting Date: 20 Mar 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 138153315

Document Ref. No.: 33606-01

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

CPV Classification

38511100 - Scanning electron microscopes

Purchaser's Detail

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Tender Details

The new device, consisting of a scanning electron microscope and a beam source with a focused plasma ion beam, is intended for applications at low temperatures (frozen biological tissue and sensitive samples such as battery materials). as well as at room temperature (all types of solid material). The device must therefore be both room temperature and cryo-compatible and enable the materials to be transferred under inert gas/vacuum conditions. Both The main applications are the production of thin lamellae for examination in the transmission electron microscope and the production of cylindrical samples for examination using X-rays in the synchrotron. Other important ones Applications include the examination of material surfaces (including cross sections produced with the ion beam), the production of 3D FIB tomograms and prototyping. The device's capabilities should also be enhanced by a fluorescence light microscope and Energy dispersive X-ray spectroscopy can be supplemented. Main CPV: 38511100 Scanning electron microscopes
Contract duration: Not specified Round of questions 1, Submit by: 02.04.2026 Submission of tender: 20.04.2026, 14:00 Tender valid until: 180 Days after submission deadline Opening of tenders: 21.04.2026

Documents

 Tender Notice