COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has floated a tender for Optical Microscope. The project location is USA and the tender is closing on 23 Dec 2025. The tender notice number is NIST-SS26-CHIPS-42, while the TOT Ref Number is 131766675. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Expired Tender

Procurement Summary

Country: USA

Summary: Optical Microscope

Deadline: 23 Dec 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 131766675

Document Ref. No.: NIST-SS26-CHIPS-42

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

Name: Login to see tender_details

Address: Login to see tender_details

Email: Login to see tender_details

Login to see details

Tender Details

NIST-SS26-CHIPS-42

PLEASE NOTE THIS A SOURCES SOUGHT NOTICE ONLY

Title: Optical Microscope

BACKGROUND

NIST CHIPS Metrology R&D program has nondestructive defect detection metrology (NDDM) for semiconductor advanced packaging project. The NDDM project aims at developing reference defect artifacts and characterizing defective semiconductor samples to help improve x-ray computed tomography (xCT) defect detection metrology and accuracy of detection. This is critical for improving efficiency and productivity of semiconductor failure analysis process. The defect artifacts- engineered defects and defective semiconductor samples- defects need to be characterized to provide ground truth information which will be compared to xCT-based defect detection results. In order to characterize the ground truth defect information, the defect artifacts and defective semiconductor materials need to be destructively measured using methods such as precision mechanical polishing. Cross-sectioning or delayering processes will be implemented on the samples, which require accurate sample alignments through micrometer adjustments and precision polishing through digital dial indicators. The cross sections or the delayered planes are measured using an optical microscope optimized for the polisher sample holders and polishing process. The optical microscope should be able to auto-focus the cross-section or the layer, and equipped with motorized translational stages. The microscope should allow installation of multiple objective lenses. The microscope should be integrated with a digital camera and a computer.

The minimum requirements are as follows:

Line Item 0001:

Description: Optical microscope

Quantity: 1

Technical Specifications

Hardware



The optical microscope shall be an upright microscope capable of reflected light measurements.

The optical microscope shall be equipped with light-emitting diode (LED) light source(s).

The optical microscope sha...
Notice ID: nist-ss26-chips-42
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Inactive Dates: jan 07, 2026
Inactive Policy: 15 days after response date

Documents

 Tender Notice


GiZ Tenders India

Procurement Documents for USA

Access a comprehensive library of standard procurement documents specific to USA. Here, you'll find all the essential forms, guidelines, and templates required for tender applications and submissions in USA

Explore Procurement Documents for USA


Want To Bid in This Tender?

Get Local Agent Support in USA and 60 More Countries.

View All The Services


View Tenders By


Publish Tenders


Have Any Dispute With The Purchaser?