Procurement Summary
Country : USA
Summary : Optical Frequency Domain Reflectometer
Deadline : 29 Apr 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 117759720
Document Ref. No. : NIST-FY25-CHIPS-0083
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Description
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
The CHIPS Metrology Program at NIST advances metrology for accelerating R&D and for developing breakthroughs that support the development of the next-generation microelectronics and ensure the competitiveness and leadership of the United States. The Microsystems and Nanotechnology Division develops micro-/nano-fabrication technologies, devices and novel measurement methods enabled by integrated microsystems.
The research work of the Microsystems and Nanotechnology Division as part of the CHIPS metrology program has a requirement for an optical frequency domain reflectometer to help develop advanced measurement methods and test structures for integrated photonics manufacturing. The need is for a system that covers the telecommunications C and L bands with high spatial resolution and high dynamic range in the analysis of back reflection and transmission signals from photonic integrated circuit components such as resonators, waveguides, couplers, interferometers, and filters. The overall system will be used for spectral measurement of reflection, transmission, and insertion loss.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Wavelength coverage: at least 1520 nm to 1630 nm Measurement modes: both reflection and transmission Laser source: external bench top unit included and satisfying all of the wavelength...
Active Contract Opportunity
Notice ID : NIST-FY25-CHIPS-0083
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Original)
Original Published Date: Apr 15, 2025 12:28 pm EDT
Original Response Date: Apr 29, 2025 01:00 pm EDT
Inactive Policy: 15 days after response date
Original Inactive Date: May 14, 2025
Initiative: None
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Place of Performance: Gaithersburg, MD 20899 USA
Documents
Tender Notice