Notice of Intent to Sole Source: Service/Maintenance Agreement for a Cameca Leap4000x-Si... Tender

Procurement Summary

Country : USA

Summary : Notice of Intent to Sole Source: Service/Maintenance Agreement for a Cameca Leap4000x-Si Atom Probe Microscope

Deadline : 15 Mar 2024

Other Information

Notice Type : Tender

TOT Ref.No.: 98196094

Document Ref. No. : NB305000-24-01128

Competition : ICB

Financier : Self Financed

Purchaser Ownership : Public

Tender Value : Refer Document

Purchaser's Detail

Purchaser : COMMERCE, DEPARTMENT OF
Contracting Office Address : GAITHERSBURG, MD 20899
Primary Point of Contact : Joni L. Laster
joni.laster@nist.gov

Secondary Point of Contact : Donald Collie
donald.collie@nist.gov
USA
Email :joni.laster@nist.gov

Tender Details

Description

The United States Department of Commerce (DOC), National Institute of Standards and Technology (NIST), Acquisition Management Division (AMD) intends to negotiate, on a sole source basis, with CAMECA INSTRUMENTS, INC, 5470 NOBEL DR, FITCHBURG, WI 53711-4963 for the purchase of a base plus 41 option year service agreement for the NIST owned LEAP 4000X Si instrument to be utilized by NIST-s CHIPS Metrology R&D Program. The statutory authority for this acquisition is 41 USC 3304(a)(1); FAR 13.106-1(b).

The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.

Laser-assisted atom probe tomography (hereafter abbreviated as “LEAP”) is of significant importance in this regard since it is the only means available to perform sub-nm-resolved 3D chemical mapping of advanced engineered solid materials. Such engineered nanostructures may be layered or segmented and consist of arbitrary chemical composition and irregular geometric shape. The proposed acquisition for continued maintenance and service of the CAMECA LEAP 4000X Si (serial number 5020) is therefore mission-critical to the CHIPS Metrology R&D Program.

Our efforts are directly aligned with the NIST mission [http://www.nist.gov/public_affairs/mission.cfm] for advancing measurement science, standards, and technology. This work also conforms to NIST's vision of being a world leader in critical measurement solutions for semiconductor manufacturers in the United States. Moreover, our work matches NIST core values which include meeting or exceeding the expectations of NIST cus...
Active Contract Opportunity Notice ID NB305000-24-01128 Related Notice Department/Ind. Agency COMMERCE, DEPARTMENT OF Sub-tier NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY Office DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Special Notice (Original)
All Dates/Times are: (UTC-05:00) EASTERN STANDARD TIME, NEW YORK, USA
Original Published Date: Mar 04, 2024 02:06 pm EST
Original Response Date: Mar 15, 2024 12:00 pm EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Mar 30, 2024
Initiative: None

Classification
Original Set Aside:
Product Service Code: J066 - MAINT/REPAIR/REBUILD OF EQUIPMENT- INSTRUMENTS AND LABORATORY EQUIPMENT
NAICS Code: 811210 - Electronic and Precision Equipment Repair and Maintenance

Place of Performance: Boulder, CO 80305 USA

Documents

 Tender Notice