Notice of Intent to Noncompetitively Acquire Chips Tender - 137813429

Procurement Summary

Country: USA

Summary: Notice of Intent to Noncompetitively Acquire Chips Leap 6000 R Atom Probe Instrument

Deadline: 27 Mar 2026

Posting Date: 14 Mar 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 137813429

Document Ref. No.: NIST-SS26-CHIPS-85

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

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Tender Details

This notice is not a request for a quotation. A solicitation document will not be issued and quotations will not be requested.
This acquisition is being conducted under the authority of RFO 12.102
In response to the CHIPS for America Act, NIST has a mission to perform and develop measurement science requested to support the domestic semiconductor industry. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts to support multiple projects. To meet this requirement a LEAP instrument is required. semiconductor industry. A particular research focus of the instrument will be to study the effect of laser wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of atom probe tomography (APT) measurements. Materials characterization allows NIST scientists to make direct correlations between material processing, (nano)structure, and resulting properties. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an atom probe tomography (APT) instrument. An APT instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis. In this work, the APT instrument should be capable of triggering field ion evaporation with either a voltage pulse, a synchronous voltage + laser pulse (laser provided by NIST), or a laser pulse (laser provided by NIST). It should be capable of detecting multiple hits with high fidelity, have a wide field-of-view, high mass resolving power, and high detection efficiency such that it can be applied to complex heterogenous samples containing m...
Notice ID: nist-ss26-chips-85

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: apr 11, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice