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The DUTCH ORGANIZATION FOR APPLIED SCIENCE RESEARCH TNO has issued a Tender notice for the procurement of a Metrology Sem+Fib System in the Netherlands. This Tender notice was published on 28 Jul 2026 and is scheduled to close on 07 Sep 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 146043496, while the tender notice number is WS2640013718 and Registering on the platform.
Procurement Summary
Country: Netherlands
Summary: Metrology Sem+Fib System
Deadline: 07 Sep 2026
Posting Date: 28 Jul 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 146043496
Document Ref. No.: WS2640013718
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
31712000 - Microelectronic machinery and apparatus and microsystemsPurchaser's Detail
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Login to see detailsTender Details
Metrology Sem+Fib System Omschrijving:The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymerbased planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Main mission (CPV code):31712000-0 Microelectronic machines and equipment and microsystems Additional assignment(s) (CPV code):38900000-4 Miscellaneous equipment for assessment and testing
Legal Framework: Procurement Act 2012 Command Type: Deliveries Procedure: Public Keywords: Scanning Electron Microscope, Focused Ion Beam, SEMFIB Main assignment (CPV code): 31712000-0 Microelectronic machines and equipment and microsystems Additional order(s) (CPV code): 38900000-4 Various equipment for assessment and testing Place of Performance NUTS code: Agglomeration The Hague (NL361) Tendered Reference Number: 604044 PB/S Number: 519634-2026
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