Manual On-Wafer Radio Frequency Probing System Tender - 6412089

Procurement Summary

Country: USA

Summary: Manual On-Wafer Radio Frequency Probing System

Deadline: 20 May 2016

Posting Date: 09 May 2016

Other Information

Notice Type: Tender

TOT Ref.No.: 6412089

Document Ref. No.: NNC16584236Q

Competition: ICB

Financier: Self Financed

Purchaser Ownership: -

Tender Value: Refer Document

CPV Classification

34900000 - Miscellaneous transport equipment and spare parts
38100000 - Navigational and meteorological instruments

Purchaser's Detail

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Tender Details

Nasa/grc has a requirement for a manual on-wafer radio frequency probing system. The specifications are as follows:
1. Two quantities of magnet-based rf probe positioners with travel range of 12.5 mm in the x-y-z directions and resolution of at least 3 microns
2. Two quantities of rf probe arms compatible with the probe positioners
3. Six inch diameter rf chuck stage to support wafer with better than +/- 3 microns planarity
4. Platen contact/separation stroke of 200 microns
5. Fine angular (theta) adjustment for the platen to ensure accurate rf probe-to-pad alignment
6. Rf probe contact height gauge with reliable and repeatable contact quality
7. Calibration or impedance standard substrate for ground-signal-ground (gsg) rf probes with pitch ranging from 100 to 250 microns
8. Two flexible gore coaxial cable 120 cm long with 2.92 mm connectors at both ends for interfacing the gsg probes with the network analyzer
9. Two quantities of air coplanar gsg probes, pitch 200 microns, frequency range of dc to 40 ghz and must be compatible with the rf probe arms
10. Rf platen with at least 4 cm travel range and probe positioner rails
11. Rf chuck movement in the x and y directions with better than 5 microns resolution
12. Rf chuck stage roll-out of at least 9 cm
13. Built-in vibration isolation to protect the contact quality and minimize probe pad damage
14. At least 6 x trinocular stereo zoom microscope with at least 150x magnification for accurate probe placement on miniature pads
15. Boom stand to support the microscope
16. Led ring-light for excellent image contrast and long lifetime and also with c-mount
17. Accessories set and tweezers for handling the wafer
18. Full wincal xe license for accurate on-wafer measurement calibration and s-parameter measurement
19. Two quantities of 2.4 mm to 2.92 coaxial adapters
20. Color ccd digital camera at least 1/3 inch diameter with c-mount and remote control to view the probe contact on the mmic pads and with user selectable cross-hair function
21. Thin film transistor wide-screen color monitor at least 23 inch in dimension to view the image
nasa/grc intends to purchase the radio frequency probing system from cascade microtech inc., 9100 sw gemini drive, beaverton, or 97008-7127 as it is compatible with our existing network analyzer and meets all microwave test and measurement requirements.
The government intends to acquire a commercial item using far part 12.
Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. Local time on may 20, 2016.

Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government.
Oral communications are not) acceptable in response to this notice.
Nasa clause 1852.215-84, ombudsman, is applicable. The center ombudsman for this acquisition can be found at http://prod.nais.nasa.gov/pub/pub_library/omb.html.
Nasa/glenn research center, 21000 brookpark road

cleveland, ohio 44135

united states
primary point of contact.:

nancy m. Shumaker,

purchasing agent

[email protected]

phone: 2164332133 general information
66 -- instruments & laboratory equipment

naics code:

334 -- computer and electronic product manufacturing/334515 -- instrument manufacturing for measuring and testing electricity and electrical signals
334 -- computer and electronic product manufacturing/334515 -- instrument manufacturing for measuring and testing electricity and electrical signals

for help: federal service deskaccessibility

added: may 06, 2016 10:41 am

Documents

 Tender Notice