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Low Temperature Scanning Tunneling Microscope Tender - 28588227

The DEPARTMENT OF ENERGY has issued a Tender notice for the procurement of a Low Temperature Scanning Tunneling Microscope (Lt-Stm) in the USA. This Tender notice was published on 20 Nov 2018 and is scheduled to close on 29 Nov 2018, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 28588227, while the tender notice number is ACSS1119 and Registering on the platform.

Procurement Summary

Country: USA

Summary: Low Temperature Scanning Tunneling Microscope (Lt-Stm)

Deadline: 29 Nov 2018

Posting Date: 20 Nov 2018

Other Information

Notice Type: Tender

TOT Ref.No.: 28588227

Document Ref. No.: ACSS1119

Competition: ICB

Financier: Self Financed

Purchaser Ownership: -

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Statement of work/specifications
this fabrication account aims to develop an ultrafast laser stm that combines a femtosecond laser with low temperature scanning tunneling microscope (lt-stm) for spectroscopy at atomic spatial resolution and femtosecond time resolution. This requisition is for an lt-stm that can be integrated with a laser later for the laser-stm system.
List of requirements:
•ultrahigh vacuum (uhv) scanned probe microscope (spm) with a base pressure below 10^-10 torr
•spm head cooled by liquid helium (lhe) bath cryostat and liquid nitrogen (ln2) shielding for operation temperatures below 5 k
•more than 60 hours of uninterrupted experimental measrement time before either lh2 or ln2 dewar needs to be refilled
•all components within the uhv chamber bakable to 140c
•high resolution scanning tunneling microscope (stm) with atomic scale spatial resolution (xy resolution below 1 angstrom)
•demonstrated ability to perform stm spectroscopy with atomic spatial resolution and energy resolution limited only by kt
•q-plus afm function with q factor above 10k
•optical components (such as lens and parabolic mirrors) within the uhv chamber to focus light to and collect light from the spm junction
•numerical apperture of the optical system above 0.4
•low temperature and high gain current amplifier within the uhv chamber with current resolution below 100 fa
•optical components covering wavelength range from 400 nm to 1 um
•more than 4 ports with line of sight to the spm junction for optical accesses or in-situ evaporation
•uhv preparation chamber with the ability to sputter and anneal the sample and transfer to spm without breaking vacuum
•load lock chamber to introduce samples from ambient to uhv chambers
•manipulator(s) to transfer sample(s) between different chambers without breaking uhv
•powered by 120v/60 hz ac power
1 cyclotron road
berkeley, california 94720
united states
primary point of contact.:
alan chan,
principal s...

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