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Ion Mill for Transmission Electron Microscope Tender - 139675384

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Ion Mill for Transmission Electron Microscope Specimens in the USA. This Tender notice was published on 17 Apr 2026 and is scheduled to close on 30 Apr 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 139675384, while the tender notice number is NIST-SS26-109 and Registering on the platform.

Procurement Summary

Country: USA

Summary: Ion Mill for Transmission Electron Microscope Specimens

Deadline: 30 Apr 2026

Posting Date: 17 Apr 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 139675384

Document Ref. No.: NIST-SS26-109

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Notice ID Number: NIST-SS26-109
Title: Ion mill for transmission electron microscope specimens
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs.
BACKGROUND
To support the CHIPS for America Act, the NIST Precision Imaging Facility (PIF) requires an ion milling system to provide final thinning to transmission electron microscope specimens. The coating system is intended to support the scanning electron microscope, focused ion beam, and transmission electron microscope instruments (among others) in the PIF.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
TECHNICAL REQUIREMENTS:
Line Item 0001: Sputter coater for scanning electron microscopy
Quantity: One (1)
Technical Specifications:
Function
The system shall be capable of milling/polishing specimens for transmission electron microscopy using one or more ion beams.
Chamber/Stage
The system shall be able to hold standard 3 mm diameter transmission electron microscope grids and/or half grids which are typically used during focused ion beam preparation.
The stage shall rotate 360°
Offerors shall comment on the ability of the stage to be cooled using liquid nitrogen
Ion Source(s)
The system shall have two or more independently adjustable ion sources.
The energy of the ion sources shall be adjustable. Offerors shall comment on the ion source energy range.
The angle of the ion sources shall be adjustable relative to the specimen.
Offerors shall comment on whether ion source angles are motorized.
Imaging and illumination
The system shall include a microscope to image the specimen during ion milling.
Illumination of the specimen for microscope imaging shall be ...
Notice ID: nist-ss26-109

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: may 15, 2026

Inactive Policy: 15 days after response date

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