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The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Interferometry Laser Combined Sources Sought Notice and Notice of Intent to Sole Source in the USA. This Tender notice was published on 13 Dec 2025 and is scheduled to close on 26 Dec 2025, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 132009460, while the tender notice number is NIST-SS26-CHIPS-53 and Registering on the platform.
Procurement Summary
Country: USA
Summary: Interferometry Laser Combined Sources Sought Notice and Notice of Intent to Sole Source
Deadline: 26 Dec 2025
Posting Date: 13 Dec 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 132009460
Document Ref. No.: NIST-SS26-CHIPS-53
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Toptica Photonics Inc, 1120 Pittsford Victor Rd, Pittsford, NY, under the authority of FAR 13.106-1(b)(1)(i). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
BACKGROUND
As part of the CHIPS R&D Program, the National Institute of Standards and Technology (NIST) Physical Measurement Laboratory (PML), Microsystems and Nanotechnology Division (MND), works on sensing methods using micromechanical resonators to perform critical physical measurements for measurands including acceleration, pressure, sound, and mass. For this procurement, the MND require a tunable laser that will used in mass sensing experiments for atomic layer deposition processes used widely in semiconductor manufacturing.
The MND requires a tunable diode laser operating around a wavelength of 780 nm to perform laser interferometry on microwave acoustic devices. These devices are being used to characterize atomic layer deposition (ALD) processes, providing high time and mass resolution for the deposition dynamics of these processes. This is part of a larger effort to perform high-fidelity process metrology for ALD and use the resulting data sets to build a digital twin of ALD processes. ALD is essential for state-of-the-art semiconductor manufacturing, where it is used to create electrical isolation layers in transistors that are a countable number of atoms thick. The resulting ALD digital twin will allow U.S. manufacturers to optimize process conditions using virtual models, thereby increasing fabrication yield and pushing towards the fundament...
Notice ID: nist-ss26-chips-53
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Product Service Code: 6640 - laboratory equipment and supplies
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Inactive Dates: jan 10, 2026
Inactive Policy: 15 days after response date
Documents
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