In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL Tender

Procurement Summary

Country: USA

Summary: In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL

Deadline: 08 Sep 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 125599409

Document Ref. No.: 140G0225Q0088

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Description

In Lens Field Emission Scanning Electron Microscope brand name or equal to JEOL USASpecial Notice of Intent to Award a Sole Source Procurement. THIS IS NOT A REQUEST FOR QUOTE. THIS IS A NOTICE OF THE GOVERNMENT'S INTENT TO ISSUE A SOLE SOURCE AWARD. This Notice is to announce that the U.S. Department of the Interior (DOI), U.S. Geological Survey (USGS), Geology, Geophysics, and Geochemistry Science Center is proposing to negotiate a contract with JEOL USA, Inc. on a sole source basis for the purchase of a demo unit JEOL JSM-IT800(HL) in-lens field emission gun scanning electron microscope (FESEM).The proposed action is for products/services for which the Government intends to solicit and negotiate with only one source under the authority FAR 13.106-1(b)(1). The reason justifying this sole source procurement is that the Government believes only one responsible source can provide the products/services that will satisfy the agency's requirement.The following is a description of the product that are required but not limited to: 1. Resolution: 0.7nm @20kV, 1.3 nm @ 1kV, 3.0 nm at 15 kV2. Magnification: Photo magnification: ×10 to ×2, 000, 000 (128 × 96 mm)Display magnification: ×27 to ×5, 480, 000 (1, 280 × 960 pixels)3. Landing voltage: 0.01 to 30 kV4. Probe current and detector: 5 pA to 300 nA (30 kV)5 pA to 100 nA (5 kV)In column probe current detector presentAbsorbed current meter5. Imaging Detectors: Secondary electron detector (SED)Upper electron detector (UED)Low vacuum secondary electron detectorRetractable backscattered electron detectorChamber camera6. Other Detectors: 60 mm SDD EDS DetectorSystem must be compatible with JEOL SxES detector7. Electron gun:In-lens Schottky Plus field emission electron gun8. Emitter warranty period 3 years9. Aperture angle control lens (ACL): Built-in10. Objective lens: Hybrid Lens11. Specimen stage control: Full eucentric goniometer stage, 5-axis motor driveStage movement range - x:70mm Y:50mm Z:1 to 41mm Tilt: -5 to ...
Active Contract Opportunity
Notice ID : 140G0225Q0088
Related Notice : 140G0225Q0088
Department/Ind. Agency : INTERIOR, DEPARTMENT OF THE
Sub-tier : US GEOLOGICAL SURVEY
Office: OFC OF ACQUISITION GRANTS-DENVER
General Information
Contract Opportunity Type: Special Notice (Original)
Original Published Date: Sep 02, 2025 07:22 am MDT
Original Response Date: Sep 08, 2025 02:30 pm MDT
Inactive Policy: Manual
Original Inactive Date: Sep 09, 2025
Initiative:
Classification
Original Set Aside:
Product Service Code: 6650 - OPTICAL INSTRUMENTS, TEST EQUIPMENT, COMPONENTS AND ACCESSORIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance:

Documents

 Tender Notice

Notice_of_Intent_to_Sole_Source_2.pdf