High Resolution Field Emission Scanning Electron Microscope Tender, Canada - 127536236

YORK UNIVERSITY has floated a tender for High Resolution Field Emission Scanning Electron Microscope. The project location is Canada and the tender is closing on 30 Oct 2025. The tender notice number is P26-087, while the TOT Ref Number is 127536236. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Expired Tender

Procurement Summary

Country: Canada

Summary: High Resolution Field Emission Scanning Electron Microscope

Deadline: 30 Oct 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 127536236

Document Ref. No.: P26-087

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Address:York UniversityProcurement Services4700 Keele StreetToronto, OntarioCanada, M3J 1P3 Description:York University Faculty of Science is seeking to acquire High Resolution Field Emission Scanning Electron Microscope with Energy Dispersive Spectroscopy. The Microscope must be equipped with Correlative and Volume Microscopy tools.A Schottky Field Emission Scanning Electron Microscope is preferable. The microscope must combine high- and low-voltage ultra-high-resolution capabilities with variable pressure design.The Microscope shall demonstrate flexibility to image a wide range of different sample materials including insulating materials, biomaterials and magnetic or magnetisable materials (including nanoparticles), achieving resolution of 0.5 nm or better @ 15kV and 1 nm or better at 1kV in the High Vacuum mode without sample/state biasing.An Energy Dispersive x-ray Microanalysis system for rapid and comprehensive investigation of a sample with real-time chemical feedback, including tools required to perform qualitative and quantitative analysis, image capture, and x-ray spectral mapping and line scanning is required. The system shall be equipped with 100 large area Analytical Silicon Drift Detector with resolution guaranteed on Mn K - 127eV at 130, 000 cps.York will only consider Proposal submissions received from Proponents who have registered with MERx (www.MERx.com) for this competitive bid. Proposal submissions from Proponents who have not registered and obtained this ...
Solicitation Type : RFP - Request for Proposal (Formal)
Reference Number : 0000304165
Location : Canada, Ontario, Toronto
Purchase Type : One Time Only- Delivery Date:2026/03/30
Description : Address:York UniversityProcurement Services4700 Keele StreetToronto, OntarioCanada, M3J 1P3 Description:York University Faculty of Science is seeking to acquire High Resolution Field Emission Scanning Electron Microscope with Energy Dispersive Spectroscopy. The Microscope must be equipped with Correlative and Volume Microscopy tools.A Schottky Field Emission Scanning Electron Microscope is preferable. The microscope must combine high- and low-voltage ultra-high-resolution capabilities with variable pressure design.The Microscope shall demonstrate flexibility to image a wide range of different sample materials including insulating materials, biomaterials and magnetic or magnetisable materials (including nanoparticles), achieving resolution of 0.5 nm or better @ 15kV and 1 nm or better at 1kV in the High Vacuum mode without sample/state biasing.An Energy Dispersive x-ray Microanalysis system for rapid and comprehensive investigation of a sample with real-time chemical feedback, including tools required to perform qualitative and quantitative analysis, image capture, and x-ray spectral mapping and line scanning is required. The system shall be equipped with 100 large area Analytical Silicon Drift Detector with resolution guaranteed on Mn K - 127eV at 130, 000 cps.York will ...

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