Procurement Summary
Country: Canada
Summary: High Resolution Field Emission Scanning Electron Microscope
Deadline: 30 Oct 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 127536236
Document Ref. No.: P26-087
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Address:York UniversityProcurement Services4700 Keele StreetToronto, OntarioCanada, M3J 1P3 Description:York University Faculty of Science is seeking to acquire High Resolution Field Emission Scanning Electron Microscope with Energy Dispersive Spectroscopy. The Microscope must be equipped with Correlative and Volume Microscopy tools.A Schottky Field Emission Scanning Electron Microscope is preferable. The microscope must combine high- and low-voltage ultra-high-resolution capabilities with variable pressure design.The Microscope shall demonstrate flexibility to image a wide range of different sample materials including insulating materials, biomaterials and magnetic or magnetisable materials (including nanoparticles), achieving resolution of 0.5 nm or better @ 15kV and 1 nm or better at 1kV in the High Vacuum mode without sample/state biasing.An Energy Dispersive x-ray Microanalysis system for rapid and comprehensive investigation of a sample with real-time chemical feedback, including tools required to perform qualitative and quantitative analysis, image capture, and x-ray spectral mapping and line scanning is required. The system shall be equipped with 100 large area Analytical Silicon Drift Detector with resolution guaranteed on Mn K - 127eV at 130, 000 cps.York will only consider Proposal submissions received from Proponents who have registered with MERx (www.MERx.com) for this competitive bid. Proposal submissions from Proponents who have not registered and obtained this ...
Solicitation Type : RFP - Request for Proposal (Formal)
Reference Number : 0000304165
Location : Canada, Ontario, Toronto
Purchase Type : One Time Only- Delivery Date:2026/03/30
Description : Address:York UniversityProcurement Services4700 Keele StreetToronto, OntarioCanada, M3J 1P3 Description:York University Faculty of Science is seeking to acquire High Resolution Field Emission Scanning Electron Microscope with Energy Dispersive Spectroscopy. The Microscope must be equipped with Correlative and Volume Microscopy tools.A Schottky Field Emission Scanning Electron Microscope is preferable. The microscope must combine high- and low-voltage ultra-high-resolution capabilities with variable pressure design.The Microscope shall demonstrate flexibility to image a wide range of different sample materials including insulating materials, biomaterials and magnetic or magnetisable materials (including nanoparticles), achieving resolution of 0.5 nm or better @ 15kV and 1 nm or better at 1kV in the High Vacuum mode without sample/state biasing.An Energy Dispersive x-ray Microanalysis system for rapid and comprehensive investigation of a sample with real-time chemical feedback, including tools required to perform qualitative and quantitative analysis, image capture, and x-ray spectral mapping and line scanning is required. The system shall be equipped with 100 large area Analytical Silicon Drift Detector with resolution guaranteed on Mn K - 127eV at 130, 000 cps.York will ...
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