Heated Probing Station with Optical Access Tender in USA - 147132615

Procurement Summary

Country: USA

Summary: Heated Probing Station with Optical Access

Deadline: 19 Aug 2026

Posting Date: 13 Aug 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 147132615

Document Ref. No.: NIST-SS26-176

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

BACKGROUND
The National Institute of Standards and Technology (NIST) requires a heated probing station with optical access and a controlled environment to integrate into a optics system The project is being pursued to support the development of electo-optical measurements of defect states to support projects in diamond magnetometry and wide-bandgap semiconductors. The probe station will be used for testing the optoelectronic behavior of defects by allowing low noise electrical measurements of defects.
The National Institute of Standards and Technology (NIST) has a requirement for a heated probing station with optical access and a controlled environment and is seeking information from sources that may be capable of providing a solution that will achieve the specifications described below:
The Contractor shall provide one (1) heated probing station with optical access and a controlled environment that meet the following minimum specifications:
The system must have a minimum of four electrical probes with 10 fA or lower noise, including low noise during heated measurements. System must allow for electrical isolation of the sample stage.
The system must allow movement of the probes using micromanipulators without breaking the environmental control (vacuum). XYZ micromanipulators can be mechanically or remotely controllable (i.e., through piezo-electric positioners) and have positional accuracy of 20 microns with
The sample mounting plate must be electrically isolated from the chamber, with external electrical connection such as a BNC or triaxial connector.
Environmental control to include vacuum down to 0.01 Torr or better, and access for gas purging
The system must evenly heat sample substrates of up to 10 mm x 10 mm up to temperature of 400° C with temperature stability of
Sample area must allow samples of 10 mm x 10 mm with thickness of up to 1 mm.
The system must be within the dimensions required by the current optics set up...
Notice ID: nist-ss26-176

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: sep 03, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice