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The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Focused Ion Beam Scanning Electron Microscope Fibsem Instrument in the USA. This Tender notice was published on 10 Feb 2026 and is scheduled to close on 23 Feb 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 135447334, while the tender notice number is 1333ND26QNB030053 and Registering on the platform.
Procurement Summary
Country: USA
Summary: Focused Ion Beam Scanning Electron Microscope Fibsem Instrument
Deadline: 23 Feb 2026
Posting Date: 10 Feb 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 135447334
Document Ref. No.: 1333ND26QNB030053
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.
Notice ID: 1333nd26qnb030053
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Product Service Code: 6640 - laboratory equipment and supplies
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Inactive Dates: mar 10, 2026
Inactive Policy: 15 days after date offers due
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