Fieldemission Scanning Electron Microscope Fesem Tender - 145577985

Procurement Summary

Country: USA

Summary: Fieldemission Scanning Electron Microscope Fesem with Electron Backscatter Diffraction Ebsd and Energy Dispersive Spectroscopy Eds Detectors and Analytical Software

Deadline: 31 Jul 2026

Posting Date: 21 Jul 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 145577985

Document Ref. No.: NB642050-26-01074

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

This is a sources sought notice. The purpose of this notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government-s anticipated needs.
NIST is seeking responses from all responsible sources, including large and small businesses. The North American Industry Classification System (NAICS) code for this acquisition is 334516 - Analytical Laboratory Instrument Manufacturing, with a Small Business Size Standard of 1000 employees. This notice does not constitute a Request for Proposal (RFP), Request for Quotation (RFQ), Invitation for Bids (IFB), or any commitment by the Government to issue a solicitation or award a contract. The National Institute of Standards and Technology (NIST) will not pay for any information submitted in response to this notice. Submission of information is voluntary and will not result in any obligation on the part of the Government.
NO SOLICITATION DOCUMENTS EXIST AT THIS TIME
Requests for solicitation documents will not receive a response. Respondents shall clearly mark any proprietary or restricted information. In the absence of such markings, NIST will assume unlimited rights to all technical data submitted.
BACKGROUND
Several mission-critical research projects such as Creating Helpful Incentives to Produce Semiconductors (CHIPS) program, Additive Manufacturing Benchmark Test Series (AM-Bench), Computational Materials for Qualification and Certification (CM4QC), and the NIST Center for Automotive Lightweighting (NCAL), rely on Field-Emission Scanning Electron Microscope (FE-SEM) measurements with Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) for mission-critical tasks and deliverables. Current instrumentation is insufficient to meet current and projected needs. Procuring an additional analytical FE-SEM with EDS and EBSD will support materials measurement, microstructural characterization, compositional analysis, crystallographic ...
Notice ID: nb642050-26-01074

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: aug 15, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice

Documents.zip