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EMPA ZENTRALER EINKAUF has floated a tender for Fib / Tem Ga Focused Ion Beam Instrument and Transmission Electron Microscope. The project location is Switzerland and the tender is closing on 10 Aug 2025. The tender notice number is 401149-2025, while the TOT Ref Number is 121238884. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.
Procurement Summary
Country: Switzerland
Summary: Fib / Tem Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Deadline: 10 Aug 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 121238884
Document Ref. No.: 401149-2025
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive x-ray (EDx) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
Doc Title: FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Contract Type: supplies
Document Type: Contract Notice
Contract Type: supplies
Authority Type: body-pl
Doc Title: FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Dispatch Date: 2025-06-19
Publish Date: 2025-06-20
Submission Date: 2025-08-10
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