Procurement Summary
Country: Switzerland
Summary: Fib / Tem Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Deadline: 10 Aug 2025
Other Information
Notice Type: Tender
TOT Ref.No.: 121182229
Document Ref. No.: 18784-01
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
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Login to see detailsTender Details
The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive x-ray (EDx) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
Main CPV: 38511000 Electron microscopes
Contract duration: Not specified
Round of questions 1, Submit by: 20.07.2025
Submission of tender: 10.08.2025, 23:59
Tender valid until: 180 Days after submission deadline
Documents
Tender Notice