Procurement Summary
Country : USA
Summary : ETEM Post-Column Electron Energy-Loss Spectrometer Upgrade
Deadline : 28 Apr 2025
Other Information
Notice Type : Tender
TOT Ref.No.: 118273806
Document Ref. No. : NIST-FY25-CHIPS-0078
Financier : Self Financed
Purchaser Ownership : Public
Tender Value : Refer Document
Purchaser's Detail
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Description
*****THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***.
BACKGROUND
The National Institute of Standards and Technology (NIST), Division 642, Materials Science and Engineering Division (MSED) is an organization whose mission includes developing techniques for structure and property measurements in CHIPS-relevant materials at the nanoscale under working conditions. The multimodal approach developed around the environmental transmission electron microscope (ETEM), including high-resolution imaging, diffraction, and chemical analysis techniques, such as EELS, energy-dispersive x-ray spectroscopy (EDS), cathodoluminescence (CL), and Raman spectroscopy, are currently supporting this mission.
In recent years, the semiconductor supply chain has become global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors market supply chain and R&D ecosystem gaps, NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing. To continue supporting this mission, the ETEM metrology requires a spectrometer upgrade to advance electron energy-loss spectroscopy (EELS) and high-resolution transmission electron microscopy (HRTEM) measurements in complex compound semiconductors, such as chalcogenides, nitrides, and oxides.
The ETEM Post-Column Electron Energy-Loss Spectrometer Upgrade sought here will enable low-electron-dose, high-frame-rate EELS acquisition by retrofitting a K2-IS direct-detection camera at the post-spectrometer position to measure the heterogeneity of optoelectronic structure and chemical composition in 2D and wide bandgap semiconductors with mitigated electron-beam effects. This structural or chemical heterogen...
Active Contract Opportunity
Notice ID : NIST-FY25-CHIPS-0078
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Sources Sought (Updated)
Updated Published Date: Apr 25, 2025 11:49 am EDT
Original Published Date: Apr 09, 2025 10:52 am EDT
Updated Response Date: Apr 28, 2025 12:00 pm EDT
Original Response Date: Apr 23, 2025 12:00 pm EDT
Inactive Policy: 15 days after response date
Updated Inactive Date: May 13, 2025
Original Inactive Date: May 08, 2025
Initiative: None
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Place of Performance: Gaithersburg, MD 20899 USA
Documents
Tender Notice