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Emccd Cameras Tender in Canada - 138568683

The UNIVERSITY OF WATERLOO has issued a Tender notice for the procurement of a Emccd Cameras in the Canada. This Tender notice was published on 27 Mar 2026 and is scheduled to close on 20 Apr 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 138568683, while the tender notice number is 2026-RFPN-00470 CH and Registering on the platform.

Procurement Summary

Country: Canada

Summary: Emccd Cameras

Deadline: 20 Apr 2026

Posting Date: 27 Mar 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 138568683

Document Ref. No.: 2026-RFPN-00470 CH

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Two (2) identical Electron-Multiplying Charge-Coupled Device (EMCCD) Cameras will support collaborative cathodoluminescence (CL) measurements within two separate scanning electron microscopes (SEM), one located at the University of Waterloo and one located at the National Research Council (NRC) in Edmonton, Alberta. Each system will enable the analysis of low-luminescence and low-dimensional semiconductors as part of advanced characterization activities; one will be integrated into a custom-built CL-SEM platform housed in the ultrahigh-resolution Hitachi SU8700 SEM at the University of Waterloo, while the other will be integrated into the high-resolution Hitachi S5500 SEM at the NRC.
Solicitation Type : RFP - Request for Proposal (Formal) Reference Number : 0000318541 Location : Canada, Ontario, Kitchener-Waterloo-Barrie Purchase Type : One Time Only- Delivery Date:2026/06/30 Description : Two (2) identical Electron-Multiplying Charge-Coupled Device (EMCCD) Cameras will support collaborative cathodoluminescence (CL) measurements within two separate scanning electron microscopes (SEM), one located at the University of Waterloo and one located at the National Research Council (NRC) in Edmonton, Alberta. Each system will enable the analysis of low-luminescence and low-dimensional semiconductors as part of advanced characterization activities; one will be integrated into a custom-built CL-SEM platform housed in the ultrahigh-resolution Hitachi SU8700 SEM at the University of Waterloo, while the other will be integrated into the high-resolution Hitachi S5500 SEM at the NRC.

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